Projects
Production platforms, quality case studies, and analytics demos spanning full-stack engineering, AI-assisted investigation, manufacturing quality, yield improvement, and factory digitalization.
7 projects · 2 featured
Featured
Manufacturing Quality Intelligence PlatformBuilt and deployed a full-stack manufacturing quality platform that structures investigation evidence, supports grounded RCA recommendations, and tracks corrective actions across an engineering workflow.View platform case studyFeatured
C-Series M.2 SSD FET Burnout Root-Cause AnalysisTraced intermittent FET burnout to conductive debris and PCB/socket alignment risk, then improved screening of affected units and helped reduce the confirmed defect rate from 11 ppm to 2 ppm.View case studyManufacturing Quality Anomaly Detection DashboardInteractive manufacturing-quality analytics combining baseline-derived yield signals, defect and equipment concentration, suspected false-fail review, unsupervised Isolation Forest ranking, and corrective-action pre/post comparisons.View dashboard case studyU-Series Wafer-Edge Yield Excursion AnalysisCross-period yield, retest, trace, and wafer-map analysis linked repeated NGBin 19/109 excursions to a normalized wafer-edge pattern and quantified the post-action rate change.View case studyTableau Manufacturing Quality DashboardManufacturing-quality analytics for detecting abnormal yield movement, prioritizing defect contributors, locating equipment concentration, and reviewing post-action recovery.View dashboard case studySSD Controller ESD Failure from Router GroundingConnected LI logs, electrical measurements, port concentration, process history, and equipment inspection to identify Router spindle grounding as the source of controller ESD damage.View case studySSD Ceramic Capacitor Damage from Calibration DriftConnected late-stage test failures, hardware confirmation, and calibration reference behavior to identify a hidden SMT underfill control failure and define an upstream monitoring signal.View case study